“SELF-HEALING VLSI CIRCUITS: A NEW PARADIGM FOR FAULT-TOLERANT DESIGNS IN IOT DEVICES”, MIR, vol. 19, no. 1, pp. 419–434, May 2025, Accessed: May 16, 2025. [Online]. Available: https://machineintelligenceresearchs.com/index.php/mir/article/view/257